STUDY OF STRUCTURAL AND OPTICAL PROPERTIES ZN1-XCRXO (X= 0.00 & 0.02) THIN FILMS DEPOSITED BY SPRAY PYROLYSIS ROUTE

Authors

  • S.S. SWAMI Thin Films and Materials Science Research Laboratory, Department of Physics, Dayanand Science College, Latur- 413 512, Maharashtra, India.
  • P.M. JHONDALE Thin Films and Materials Science Research Laboratory, Department of Physics, Dayanand Science College, Latur- 413 512, Maharashtra, India.
  • S.V. KUMBHAR Thin Films and Materials Science Research Laboratory, Department of Physics, Dayanand Science College, Latur- 413 512, Maharashtra, India.
  • L.H. KATHWATE Thin Films and Materials Science Research Laboratory, Department of Physics, Dayanand Science College, Latur- 413 512, Maharashtra, India.
  • P.M. KULAL Department of Physics, Shivaji Mahavidhayalay, Renapur - 413 512, Maharashtra, India
  • V.D. MOTE Thin Films and Materials Science Research Laboratory, Department of Physics, Dayanand Science College, Latur- 413 512, Maharashtra, India.

Keywords:

Zn1-xCrxO thin film, XRD pattern, UV-Visible spectra

Abstract

Objective: The High quality with low economical cost thin films has become a global need. Zn1-xCrxO (x= 0.00 & 0.02) thin film has been deposited on glass substrate by simple chemical spray pyrolysis route.

Materials and Methods:The structural and optical properties Zn1-xCrxO (x= 0.00 & 0.02) film were studied by using x-ray diffraction (XRD) pattern and UV-Visible spectra. The structural parameters such as lattice constant (a & c), strain and dislocation density was also calculated by analyzing xray diffraction pattern

Results:The entire x-ray diffraction peaks confirm that the Zn1-xCrxO films have polycrystalline nature with hexagonal (wurtzite) crystal structure. The mean crystalline size was determined by Debye-Scherrer formula. The crystallite size was found to be 32nm and 22nm for x=0.00 and x=0.02 respectively. The transmittance spectra reveal that all the films have high transmittance (higher than 80%) in the range of visible and near to the infrared wavelength region. There was decreasing band gap with Cr (x=0.02) doping concentration.

Conclusion: Structural and optical properties reveal that films are of good quality that are suitable for several applications.

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Published

31-05-2020

How to Cite

SWAMI, S., JHONDALE, P., KUMBHAR, S., KATHWATE, L., KULAL, P., & MOTE, V. (2020). STUDY OF STRUCTURAL AND OPTICAL PROPERTIES ZN1-XCRXO (X= 0.00 & 0.02) THIN FILMS DEPOSITED BY SPRAY PYROLYSIS ROUTE. Innovare Journal of Sciences, 8(7), 98–100. Retrieved from https://journals.innovareacademics.in/index.php/ijs/article/view/38549

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